TDTR

Femtosecond laser-based Time-Domain Thermoreflectance (TDTR) is one of the most advanced thermal characterization techniques for micro- and nanoscale materials. The TDTR system independently developed by CSMH enables the measurement of key thermal properties, including thermal conductivity, thermal diffusivity, interfacial thermal resistance, and thermal boundary conductance, for materials such as diamond, semiconductors, and metals.The system supports measurements of both bulk samples and thin-film structures with thicknesses ranging from tens of nanometers to several micrometers. It employs a non-contact measurement approach and can operate under ambient conditions or perform measurements through optical windows in a vacuum chamber.